
Quantifying Intermetallic Diffusion Kinetics in Lead Free Packaging
Quantifying intermetallic kinetics requires controlling reflow thermal input and substrate metallurgy to prevent brittle interface fracture during service.

Quantifying intermetallic kinetics requires controlling reflow thermal input and substrate metallurgy to prevent brittle interface fracture during service.

Control reflow peak dwell and solid-state thermal exposure to limit interfacial intermetallic growth below four micrometers, preventing brittle joint fracture.

Excessive intermetallic layer growth and Kirkendall voiding cause brittle solder joint field failures that require precise contractual latent defect rules.

Sub-micron IMC growth in micro-BGA arrays shifts from boundary to volumetric diffusion, driving Cu3Sn formation and Kirkendall voiding that cuts shear strength.
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