
Measuring Intermetallic Phase Growth in Lead Free Solder Joints
Accurate intermetallic phase growth measurement requires bevel-free metallographic polishing, etching chemical selection, and kinetic modeling to set supplier liability limits.
Destructive pull tests performed on solder spheres at low speeds identify the tensile strength of the bond and the primary failure mechanism at the intermetallic interface. This solder ball cold bump pull test is a standard method for evaluating the quality of the connection between a ball grid array package and the printed circuit board. Unlike high speed tests that focus on impact resistance, the “cold” or low speed pull is designed to assess the quasi-static strength of the metallurgical bond.
The test involves gripping a single solder ball with a specialized pair of tweezers and pulling it vertically until it separates from the pad. The peak force required for separation is recorded, and the resulting fracture surface is categorized to determine if the bond was healthy or defective. This technique is widely used by quality control departments in Chinese electronics factories to monitor the performance of their reflow lines and to verify the quality of the incoming substrates.
Alignment of the pulling tool and the selection of the correct jaw pressure are the most critical factors for obtaining accurate results from the procedure. The solder ball cold bump pull equipment must be able to apply a perfectly vertical force to avoid introducing shear stresses that would skew the data. Because the solder ball is soft, the jaws of the pulling tool must grip it firmly without causing so much deformation that the ball is cut or squashed.
The pull speed is typically kept very low, around five to ten millimeters per minute, to allow for a steady buildup of stress in the joint. This slow loading rate is ideal for identifying problems such as weak intermetallic formation or contaminated pads, which might be missed by faster tests. Engineers use the peak force data to calculate the average bond strength for a specific component and to check for consistency across the entire board.
Inspection of the area where the separation occurred provides the most valuable information about the root cause of any weakness. After the solder ball cold bump pull is completed, the pad on the board and the bottom of the solder ball are examined under a high power microscope. A ductile failure where the solder itself is torn indicates that the intermetallic bond is stronger than the bulk material, which is the desired outcome.
A brittle failure where the solder separates cleanly from the pad or from the intermetallic layer suggests a problem with the surface finish or the reflow process. This is often referred to as an “interfacial” failure and is a major red flag for reliability. Common causes include “black pad” on ENIG finishes, oxidation of the copper pads, or insufficient heat during reflow.
Categorizing these failure modes allows the quality team to pinpoint the exact stage of the manufacturing process that needs improvement.
Comparison of the test results against historical data and industry benchmarks helps to define the window of acceptability for a production run. Most manufacturers have internal standards for the minimum pull force based on the diameter of the solder ball. If a batch of boards shows a lower than expected average force or a high number of brittle failures during the solder ball cold bump pull, the entire lot may be quarantined for further investigation.
This test is also used during the qualification of new suppliers or when switching to a different solder paste manufacturer. By providing a direct measure of the bond integrity, it offers a more reliable assessment of quality than visual inspection alone. The data is often presented in a Pareto chart to show the frequency of different failure types, making it easier for management to see where to focus their resources.
This commitment to rigorous mechanical testing is what ensures that the final product will survive the mechanical stresses of assembly, testing, and shipping to the end user. The final report serves as the definitive record of the mechanical quality of the interconnect.

Accurate intermetallic phase growth measurement requires bevel-free metallographic polishing, etching chemical selection, and kinetic modeling to set supplier liability limits.
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