Meaning
Standardized procedure established by the JEDEC Solid State Technology Association for conducting high temperature operating life tests on integrated circuits. Adherence to jesd22-a108 ensures that reliability data produced by different laboratories is comparable and repeatable. Test protocols specify the test environment, the sample size, the failure criteria and the reporting format.
Test Duration
Requirements typically mandate a minimum of one thousand hours of continuous operation at the maximum rated junction temperature. This duration provides a sufficient window to observe the most common failure modes in silicon devices. Periodic functional checks ensure that the devices remain within their performance specifications throughout the stress period.
Operational Constraint
Procedure is strictly controlled to prevent the introduction of artificial failure mechanisms that would not occur in the field. Alignment with JEDEC protocols is often accepted as equivalent to the corresponding GB/T national standards for semiconductor reliability in the Chinese regulatory landscape. Test equipment must provide a stable voltage with minimal noise to avoid overstressing the delicate gate oxides of the transistors.
Custom Compliance
Documentation of the test setup and the raw data must be maintained for several years to satisfy the audit requirements of the General Administration of Customs. Proof of testing is often required to claim the tax benefits associated with the production of high reliability electronic components.
